Tsai Cher-Shiung | Department of Electronic Engineering, Kun Shan University, 949 Da-Wan Road, Yung-Kang, Tainan Hsien 710, Taiwan, R.O.C.

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• Department of Electronic Engineering, Kun Shan University, 949 Da-Wan Road, Yung-Kang, Tainan Hsien 710, Taiwan, R.O.C.の論文著者

Department of Electronic Engineering, Kun Shan University, 949 Da-Wan Road, Yung-Kang, Tainan Hsien 710, Taiwan, R.O.C. | 論文

• Trivalued Memory Circuit Using Metal–Oxide–Semiconductor Field-Effect Transistor Bipolar-Junction-Transistor Negative-Differential-Resistance Circuits Fabricated by Standard SiGe Process

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