Wada Toshikazu | the Faculty of System Engineering, Wakayama University

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the Faculty of System Engineering, Wakayama University | 論文

• Wear Durability and Adhesion Evaluation Methods for Ultrathin Overcoat Films by Atomic Force Microscopy
• RK-Means Clustering : K-Means with Reliability
• K-means clustering based pixel-wise object tracking (コンピュータビジョンとイメージメディア)
• Object Tracking with Target and Background Samples(Image Recognition, Computer Vision)
• K-means tracker : A multiple colors object tracking algorithm

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