YEH W.-K. | Department of Electrical Engineering, National University of Kaohsiung
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概要
Department of Electrical Engineering, National University of Kaohsiung | 論文
- Efficient Improvement on Device Performance for sub-90nm CMOSFETs
- An Efficient Mobility Enhancement Engineering on 65nm FUSI CMOSFETs using a Second CESL Process
- Systematic Analysis and Modeling of On-Chip Spiral Inductors for CMOS RFIC Application
- Mobility Modulation Technology Impact on Device Performance and Reliability for sub-90nm SOI CMOSFETs
- The Impact of Body-Potential on Hot-Carrier-Induced Device Degradation for 90nm Partially-Depleted SOI nMOSFETs