Kim Hyun | Division of Optical Metrology, Korea Research Institute of Standards and Science, Daejeon 305-600, South Korea

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• Kim Hyun Jongの詳細を見る
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• Division of Optical Metrology, Korea Research Institute of Standards and Science, Daejeon 305-600, South Koreaの論文著者

Division of Optical Metrology, Korea Research Institute of Standards and Science, Daejeon 305-600, South Korea | 論文

• A New Spectral Imaging Ellipsometer for Measuring the Thickness of Patterned Thin Films

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