CHEN Hsia-Wei | Institute of Electronics, National Chiao Tung University
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概要
Institute of Electronics, National Chiao Tung University | 論文
- Analysis of Narrow Width Effects in Polycrystalline Silicon Thin Film Transistors
- Characterization and Reliability of Lightly-Doped-Drain Polysilicon Thin-Film Transistors with Oxide Sidewall Spacer Formed by One-Step Selective Liquid Phase Deposition
- Dimensional Effects on the Drain Current of N-and P-Channel Polycrystalline Silicon Thin Film Transistors
- A Novel SiGe Raised Source/Drain Polycrystalline Silicon Thin-Film Transistor with Improved On-Current and Larger Breakdown Voltage
- Characteristics of Poly-Si Nanowire Thin Film Transistors with Double-Gated Structures