Takashi Kaito | SII NanoTechnology Inc., Oyama, Shizuoka 410-1393, Japan
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概要
SII NanoTechnology Inc., Oyama, Shizuoka 410-1393, Japan | 論文
- Nanotweezers with Proximity Sensing and Gripping Force Control System
- Surface Morphology of Diamond-Like Carbon Film and Si Wafer Milled with 30 keV Gallium Focused Ion Beam
- Elastic Double Structure of Amorphous Carbon Pillar Grown by Focused-Ion-Beam Chemical Vapor Deposition