MISUMI Ichiko | National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ/AIST)
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- National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ/AIST)の論文著者
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ/AIST) | 論文
- Harmonic Generation and Mixing with the W-Ni Point Contact Diode in the Far-Infrared
- Sub-Nanometer Scale Measurements of Silicon Oxide Thickness by Spectroscopic Ellipsometry
- Frequency Stability and Reproducibility of an Iodine Stabilized He-Ne Laser
- Reliability of parameters of associated base straight line in step height samples : Uncertainty evaluation in step height measurements using nanometrological AFM
- Frequency Chain to 3.39 μm CH_4-Stabilized He-Ne Laser Using Josephson Point Contact as Harmonic Mixer