Shinohara Hirofumi | Device Business Group, Oki Electric Industry Co., Ltd.
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概要
Device Business Group, Oki Electric Industry Co., Ltd. | 論文
- New Standby Degradation Mode in n-Channel MOSFETs with Thin Gate Oxide
- New Stand-By Degradation Mode in n-MOSFET's with Thin Gate Oxide
- A Highly Drivable CMOS Design with Very Narrow Sidewall and Novel Channel Profile for 3.3V High Speed Logic Application (Special Issue on Sub-Half Micron Si Device and Process Technologies)