Sittner Petr | Institute of Physics, Academy of Sciences of the Czech Republic
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概要
Institute of Physics, Academy of Sciences of the Czech Republic | 論文
- Structure and Properties of Silicon Thin Films Deposited at Low Substrate Temperatures
- Remarks on Some Reference Materials for Applications in Elastic Peak Electron Spectroscopy
- Electron Spectroscopy of Corrugated Solid Surfaces
- Electron Spectra Line Shape Analysis of Highly Oriented Pyrolytic Graphite and Nanocrystalline Diamond
- 22aPS-47 Magnetic Phase Diagram of Ce_2Fe_Mn_x Compounds under Pressure