Eto Mikio | Faculty of Science and Technology, Keio University, Yokohama 223-8522, Japan
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Faculty of Science and Technology, Keio University, Yokohama 223-8522, Japan | 論文
- Application of Graded-Index for Astigmatism Reduction in Progressive Addition Lens
- X-ray Intensity Fluctuation Spectroscopy Using Nanofocused Hard X-rays: Its Application to Study of Relaxor Ferroelectrics
- Mechanism of Negative Ion Production in a Cesium Seeded Ion Source
- Self-Assembled Nano-heterostructural Thin Film for Optical Lens
- Characterization of Self-Assembled Flexible Multilayer Electrode Film by Roll-to-Roll Process