Sugimoto Tsuneyoshi | Department of Electronics and Information, Faculty of Engineering, Toin University of Yokohama, Yokohama 225-8502, Japan

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関連著者

Sugimoto Tsuneyoshi
Department of Electronics and Information, Faculty of Engineering, Toin University of Yokohama, Yokohama 225-8502, Japan
Sano Motoaki
Department Of Applied Electronics Tokyo Institute Of Technology
Abe Touma
Department of Electronics and Information, Faculty of Engineering, Toin University of Yokohama, Yokohama 225-8502, Japan
Ohaba Motoyoshi
Faculty of Agriculture, Tokyo University of Agriculture and Technology, Fuchu, Tokyo 183-8509, Japan
Shibusawa Sakae
Faculty of Agriculture, Tokyo University of Agriculture and Technology, Fuchu, Tokyo 183-8509, Japan
Shirakawa Takashi
Department of Electronics and Information, Faculty of Engineering, Toin University of Yokohama, Yokohama 225-8503, Japan
Nakagawa Yutaka
Department of Electronics and Information, Faculty of Engineering, Toin University of Yokohama, Yokohama 225-8503, Japan
Sugimoto Tsuneyoshi
Department of Electronics and Information, Faculty of Engineering, Toin University of Yokohama, Yokohama 225-8503, Japan
Abe Touma
Inspection Division, IHI Inspection & Instrumentation Co., Ltd., Shinagawa, Tokyo 140-0014, Japan

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