Kubo Naoki | Department of Electronic and Control Systems Engineering, Shimane University, 1060 Nishi-Kawatsu, Matsue 690-8504, Japan

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• Department of Electronic and Control Systems Engineering, Shimane University, 1060 Nishi-Kawatsu, Matsue 690-8504, Japanの論文著者

Department of Electronic and Control Systems Engineering, Shimane University, 1060 Nishi-Kawatsu, Matsue 690-8504, Japan | 論文

• Spectroscopic Ellipsometry of 3C-SiC Thin Films Grown on Si Substrates Using Organosilane Sources

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