HARADA Shinsuke | National Institute of Advanced Industrial Science and Technology, Power Electronics Research Center:Ultra-Low-Loss Power Device Technology Research Body

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National Institute of Advanced Industrial Science and Technology, Power Electronics Research Center:Ultra-Low-Loss Power Device Technology Research Body | 論文

• Effects of Pyrogenic Reoxidation Annealing on Inversion Channel Mobility of 4H-SiC Metal-Oxide-Semiconductor Field-Effect Transistor Fabricated on (1120) Face

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