HOUJOH Haruo | Tokyo Institute of Technology, Precision and Intelligence Laboratory
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Tokyo Institute of Technology, Precision and Intelligence Laboratory | 論文
- Measurement of Crystallization Temperature Using Thermography for Thin Film Amorphous Alloy Samples
- OS6(P)-27(OS06W0457) Reduction of Electrical Resistivity in PdCuSi Thin Film Metallic Glass
- PRE-10 DESIGN AND FABRICATION ON A NOVEL TRAVELING WAVE TYPE CYLINDRICAL ULTRASONIC LINEAR MICROACTUATOR(MM/Micro/Nano Precision Equipments IV,Technical Program of Oral Presentations)
- Thermal, Mechanical and Electrical Properties of Pd-Based Thin-Film Metallic Glass : Surfaces, Interfaces, and Films
- Built-in Capacitive Displacement Sensor with Long Full-Scale Range for Electrostatic Microactuators