HABU Ryuichi | Electronics Research Laboratories, Nippon Steel Corporation:(Present address)Technical Research Center, Sky Alminium Co., Ltd.

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概要

関連著者

Habu Ryuichi
Electronics Research Laboratories Nippon Steel Corporation:(present Address)technical Research Cente
Tomiura Azusa
Technical Development Bureau Nippon Steel Corporation
TOMIURA Azusa
Technical Development Bureau, Nippon Steel Corporation:Nippon Steel Corporation
HABU Ryuichi
Electronics Research Laboratories, Nippon Steel Corporation:(Present address)Technical Research Center, Sky Alminium Co., Ltd.

著作論文

Distribution of Grown-in Crystal Defects in Silicon Crystals Formed by Point Defect Diffusion during Melt-Growth : Disappearance of the Oxidation Induced Stacking Faults-Ring

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