Nishiguchi Taro | Department of Electronics and Information Science, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, Japan

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概要

関連著者

Ohshima Satoru
Department Of Cardiology Nagoya University Graduate School Of Medicine
Nishino Shigehiro
Department Of Electrical Engineering Kyoto University
Nishiguchi Taro
Department Of Electronics And Information Science Kyoto Institute Of Technology
Masuda Yasuichi
Department Of Electronics And Information Science Kyoto Institute Of Technology
Ohshima Satoru
Department of Electronics and Information Science, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, Japan
Nishiguchi Taro
Department of Electronics and Information Science, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, Japan
Masuda Yasuichi
Department of Electronics and Information Science, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto 606-8585, Japan

著作論文

Reduction of Hollow Defects in 6H-SiC Single Crystals Grown by Sublimation Boule Growth Technique on ($11\bar{2}0$) 6H-SiC Substrates

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