Ishihara Ryoichi | Delft University of Technology, Delft Institute of Microelectronics and Submicron Technology (DIMES), Laboratory of Electronic Components, Technology and Materials (ECTM), Feldmannweg 17, P. O. Box 5053, 2600 GB Delft, The Netherlands

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• Delft University of Technology, Delft Institute of Microelectronics and Submicron Technology (DIMES), Laboratory of Electronic Components, Technology and Materials (ECTM), Feldmannweg 17, P. O. Box 5053, 2600 GB Delft, The Netherlandsの論文著者

Delft University of Technology, Delft Institute of Microelectronics and Submicron Technology (DIMES), Laboratory of Electronic Components, Technology and Materials (ECTM), Feldmannweg 17, P. O. Box 5053, 2600 GB Delft, The Netherlands | 論文

• Effects of Capping Layer on Grain Growth with $\mu$-Czochralski Process during Excimer Laser Crystallization

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