Bokor Jeffrey | Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA 94720, USA

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• Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA 94720, USAの論文著者

Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA 94720, USA | 論文

• Investigation of Gate-Induced Drain Leakage (GIDL) Current in Thin Body Devices: Single-Gate Ultra-Thin Body, Symmetrical Double-Gate, and Asymmetrical Double-Gate MOSFETs

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