Huang Jhih-Chao | Dep. of Electronic Engineering, Feng Chia University

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Dep. of Electronic Engineering, Feng Chia University | 論文

• Improvement of the Leakage by Second Thermal Oxidation Process Power Trench Gate MOSFET(Session6: Power Devices)
• Improvement of the Leakage by Second Thermal Oxidation Process Power Trench Gate MOSFET(Session6: Power Devices)

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