Kim Kwangryul | School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea
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概要
- Kim Kwangryulの詳細を見る
- 同名の論文著者
- School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Koreaの論文著者
関連著者
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Yi Junsin
School Of Electrical And Computer Engineering Sungkyunkwan University
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Choi Byoungdeog
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Korea
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Nguyen Van
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea
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Lee Wonbaek
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea
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Kim Kwangryul
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea
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Son Dang
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea
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Lee Wonbaek
School of Electronic Electrical Engineering, College of Information and Communication Engineering, Sungkyunkwan University, Suwon, Gyeonggi 440-746, Korea
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Choi Byoungdeog
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea
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Baek Kyunghyun
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea
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Dang Ngoc
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea
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Chung Hokyun
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea
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Jung Sungwook
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea
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Nga Nguyen
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea
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Duy Nguyen
School of Information and Communication Engineering, Sungkyunkwan University, Suwon 440-746, Republic of Korea
著作論文
- Effect of Series Resistance on Field-Effect Mobility at Varying Channel Lengths and Investigation into the Enhancement of Source/Drain Metallized Thin-Film Transistor Characteristics
- Investigation of Aluminum Metallized Source/Drain Thin Film Transistors Using a Self-Aligned Fabrication Process