Chen Hung-Tse | Electronics Research and Service Organization, Industrial Technology Research Institute, Hsinchu 30013, Taiwan, R.O.C.

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Electronics Research and Service Organization, Industrial Technology Research Institute, Hsinchu 30013, Taiwan, R.O.C. | 論文

• Reliability and Memory Characteristics of Sequential Laterally Solidified Low Temperature Polycrystalline Silicon Thin Film Transistors with an Oxide–Nitride–Oxide Stack Gate Dielectric

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