Arai Eisuke | Department of Engineering Physics, Electronics and Mechanics, Nagoya Institute of Technology, Gokiso, Showa-ku, Nagoya 466-8555, Japan

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• Department of Engineering Physics, Electronics and Mechanics, Nagoya Institute of Technology, Gokiso, Showa-ku, Nagoya 466-8555, Japanの論文著者

Department of Engineering Physics, Electronics and Mechanics, Nagoya Institute of Technology, Gokiso, Showa-ku, Nagoya 466-8555, Japan | 論文

• Excess Carrier Lifetime Measurement of Bulk SiC Wafers and Its Relationship with Structural Defect Distribution

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