CHO Byung | Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Computer Engineering, National University of Singapore

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• Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Computer Engineering, National University of Singaporeの論文著者

Center for Integrated Circuit Failure Analysis and Reliability, Department of Electrical and Computer Engineering, National University of Singapore | 論文

• Hot-Carrier Lifetime Dependence on Channel Width and Silicon Recess Depth in N-Channel Metal-Oxide-Semiconductor Field-Effect-Transistors with the Recessed Local Oxidation of Silicon Isolation Structure(Semiconductors)

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