Suh Chung | Ferroelectric Technology Department, Hyundai Electronics Industries Co., Ltd.
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- Ferroelectric Technology Department, Hyundai Electronics Industries Co., Ltd.の論文著者
Ferroelectric Technology Department, Hyundai Electronics Industries Co., Ltd. | 論文
- Stress in Inter-level Dielectric Oxides on Integrated SBT-based Ferroelectric Memories
- Stress in Inter-level Dielectric Oxides on Integrated SBT-based Ferroelectric Memories
- Stress in Inter-level Dielectric Oxides on Integrated SBT-based Ferroelectric Memories