Matsui Yoshio | Advanced Electron Microscope Group, Advanced Nano- Characterization Center, National Institute for Materials Science
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- Advanced Electron Microscope Group, Advanced Nano- Characterization Center, National Institute for Materials Scienceの論文著者
Advanced Electron Microscope Group, Advanced Nano- Characterization Center, National Institute for Materials Science | 論文
- Effect of Quenched Disorder on Charge Ordering Structure in RE_AE_NiO_4(RE=La, Pr, Nd, Sm;AE=Ca, Sr)(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
- TEM study of the influence of antisite defects on magnetic domain structures in double perovskite Ba_2FeMoO_6
- Microstructural Observation of Si_Ge_x Thin Films Prepared by Pulsed Ion-Beam Evaporation
- HRTEM study of new series of oxycarbonitrate superconductors (Cu,C,N)(n=1-6)
- Light element analysis in oxycarbonate superconductors using EELS