Schauer Petr | Institute of Scientific Instruments, Academy of Sciences of the Czech Republic
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Institute of Scientific Instruments, Academy of Sciences of the Czech Republic | 論文
- Cathode Lens Mode of the SEM in Materials Science Applications
- The potential of the scanning low energy electron microscopy for the examination of aluminum based alloys and composites
- FIB Induced Damage Examined with the Low Energy SEM
- Grain Contrast Imaging in UHV SLEEM
- Morphology of Spinels and Al_2O_3 Particles in an Al_2O_3/Al-Mg-Si Composite Material Revealed by Scanning Low Energy Electron Microscopy