スポンサーリンク
Institute of Scientific Instruments, Academy of Sciences of the Czech Republic | 論文
- Cathode Lens Mode of the SEM in Materials Science Applications
- The potential of the scanning low energy electron microscopy for the examination of aluminum based alloys and composites
- FIB Induced Damage Examined with the Low Energy SEM
- Grain Contrast Imaging in UHV SLEEM
- Morphology of Spinels and Al_2O_3 Particles in an Al_2O_3/Al-Mg-Si Composite Material Revealed by Scanning Low Energy Electron Microscopy
- Strategies for low- and very-low-energy SEM