Liao J. | Vlsi Technology Laboratory Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University

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Vlsi Technology Laboratory Institute Of Microelectronics Department Of Electrical Engineering National Cheng Kung University | 論文

• New Observations on Hot-Carrier Degradation in 0.1 μm Silicon-on-Insulator n-Type Metal Oxide Semiconductor Field Effect Transistors : Semiconductors

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