Yamasaki S | Joint Research Center For Atom Technology-national Institute For Advanced Interdisciplinary Research
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Joint Research Center For Atom Technology-national Institute For Advanced Interdisciplinary Research | 論文
- In situ ESR Observation of Interface Dangling Bond Formation Processes During Ultrathin SiO2 Growth On Si(111)
- EPR studies of the isolated negatively charged silicon vacancies in n-type 4H- and 6H-SiC: Identification of C3v symmetry and silicon sites
- Electron Spin Resonance Observation of the Si(111)- (7×7) Surface and Its Oxidation Process
- Effects of Chemical Composition and Morphology of Substrate Surfaces on Crustallinity of Ultrathin Hydrogenated Microcrystalline Silicon Films
- Microscopic origin of light-induced ESR centers in undoped hydrogenated amorphous silicon