OOSHIMA N. | System Devices Research Laboratories, NEC Corporation
スポンサーリンク
概要
関連著者
-
Ikegawa S.
Corporate Research & Development Center Toshiba Corporation
-
Yoda H.
Center For Semiconductor Research & Development Semiconductor Company Toshiba Corporation
-
UEDA T.
Corporate Research & Development Center, Toshiba Corporation
-
KISHI T.
Corporate Research & Development Center, Toshiba Corporation
-
HADA H.
System Devices Research Laboratories, NEC Corporation
-
TAHARA S.
System Devices Research Laboratories, NEC Corporation
-
OOSHIMA N.
System Devices Research Laboratories, NEC Corporation
-
Hada H.
System Devices Research Laboratories Nec Corporation
-
Kishi T.
Center For Semiconductor Research & Development Semiconductor Company Toshiba Corporation
-
Tahara S.
System Devices Research Laboratories Nec Corporation
著作論文
- Process Integration of Low-Power and High-Speed 16Mb MRAM using Multi-Layer Yoke Wiring Technology
- Thermally Stable Magnetic Tunnel Junctions for High Density MRAM