Muroya Yoshiharu | The Authors Are With Kansai Electronics Research Laboratory Nec Corp.

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概要

• MUROYA Yoshiharuの詳細を見る
• 同名の論文著者
• The Authors Are With Kansai Electronics Research Laboratory Nec Corp.の論文著者

関連著者

• Sato K

  Tokyo Univ. Agriculture And Technol. Tokyo Jpn

• Sato K

  Advanced Mobile Telecommunication Technology Inc.

• Sato K

  Ntt Network Innovation Laboratories

• Sato K

  Ykc Corp. Musashimurayama‐shi Jpn

• MUROYA Yoshiharu

  The authors are with Kansai Electronics Research Laboratory, NEC Corp.

• OKUDA Tetsuro

  The authors are with Kansai Electronics Research Laboratory, NEC Corp.

• Okuda T

  The Authors Are With Kansai Electronics Research Laboratory Nec Corp.

• Sato K

  Kyoritsu University Of Pharmacy

• Muroya Yoshiharu

  The Authors Are With Kansai Electronics Research Laboratory Nec Corp.

• SATO Koichi

  Niigata University

• Sato K

  National Inst. Health Sci. Tokyo Jpn

• YAMADA Hirohito

  Optoelectronic Industry and Technology Development Association (OITDA)

• Yamada Hirohito

  Tohoku Univ.

• Yamada Hirohito

  Kansai Electronics Research Laboratory Nec Corporation

• SATO Kenji

  The authors are with Kansai Electronics Research Laboratory, NEC Corp.

• MUROYA Yoshiharu

  Kansai Electronics Research Laboratory, NEC Corporation

• SATO Kenji

  Kansai Electronics Research Laboratory, NEC Corporation

• OKUDA Tetsuro

  Kansai Electronics Research Laboratory, NEC Corporation

• NAKAMURA Takahiro

  Kansai Electronics Research Laboratory, NEC Corporation

• TORIKAI Toshitaka

  Kansai Electronics Research Laboratory, NEC Corporation

• Torikai Toshitaka

  Kansai Electronics Research Laboratory Nec Corporation

• Nakamura Takahiro

  Kansai Electronics Research Laboratory Nec Corporation

• Sato Kenji

  The Authors Are With Central R & D Laboratory Japan Energy Co. Ltd.

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著作論文

• Desing of High Slope-Efficiency Phase-Shifted DFB Laser Diodes with Asymmetrically-Pitch-Modulated(APM) Gratings(Special Issue on Advanced Optical Devices for Next Generation Photonic Networks)
• Precisely Wavelength-Controlled Corrugation for DFB Laser Diodes Delineated by Weighted-Dose Electron-Beam Lithography(Special Issue on High-Capacity WDM/TDM Networks)

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