Bjorkman C. | Departments Of Physics Materials Science & Engineering And Electrical & Computer Engineering
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Departments Of Physics Materials Science & Engineering And Electrical & Computer Engineering | 論文
- Atomic Scale Morphology of Hydrogen-Termimated Si(100) Surfaces Studied by Fourier-Transform Infrared Attenuated Total Reflection Spectroscopy and Scanning Probe Microscopies
- Thermal Relaxation Phenomena in the Formation of Device-Quality SiO_2/Si Interfaces