Nakayama Akira | Analysis Center Kyocera Corporation

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概要

• Nakayama Akiraの詳細を見る
• 同名の論文著者
• Analysis Center Kyocera Corporationの論文著者

関連著者

• Nakayama Akira

  Analysis Center Kyocera Corporation

• Shimizu Kazuya

  Analysis Center Kyocera Corporation

著作論文

• An Improved Reflection Wave Method for Measurement of Complex Permittivity at 100MHz-1GHz
• A Measurement Method of Complex Permittivity at Pseudo Microwave Frequencies Using a Cavity Resonator Filled with Dielectric Material (Special Issue on Measurement Techniques for Microwave/Millimeter Wave)

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