Hosokawa Toshinori | Corporate Development Division Semiconductor Company Matsushita Electric Industrial Co. Ltd.:design
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Corporate Development Division Semiconductor Company Matsushita Electric Industrial Co. Ltd.:design | 論文
- Novel DFT Strategies Using Full/Partial Scan Designs and Test Point Insertion to Reduce Test Application Time(Special Section on VLSI Design and CAD Algorithms)
- Partial Scan Design Methods Based on n-Fold Line-Up Structures and the State Justification of Pure Load/Hold Flip-Flops(Special Issue on Test and Diagnosis of VLSI)