Tsuchida Hidemi | National Inst. Of Advanced Industrial Sci. And Technol. (aist) Ibaraki Jpn
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概要
関連著者
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Tsuchida Hidemi
National Inst. Of Advanced Industrial Sci. And Technol. (aist) Ibaraki Jpn
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Yoshizawa Akio
National Inst. Of Advanced Industrial Sci. And Technol. (aist) Ibaraki Jpn
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Kaji Ryosaku
National Institute Of Advanced Industrial Science And Technology (aist)
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Tsuchida Hidemi
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba 305-
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Yoshizawa Akio
National Institute Of Advanced Industrial Science And Technology (aist)
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Tsuchida Hidemi
National Institute Of Advanced Industrial Science And Technology (aist)
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ISHIKAWA Hiroshi
National Institute of Advanced Industrial Science and Technology (AIST)
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Akimoto Ryoichi
National Institute Of Advanced Industrial Science And Technology (aist)
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HASAMA Toshifumi
National Institute of Advanced Industrial Science and Technology (AIST)
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Abedin Kazi
National Inst. Of Information And Communications Technol. Tokyo
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MOZUME Teruo
National Institute of Advanced Industrial Science and Technology (AIST)
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Miyazaki Tetsuya
National Inst. Information And Communications Technol. (nict) Tokyo Jpn
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Tsuchida Hidemi
National Institute Of Advanced Industrial Science And Technology
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Miyazaki Tetsuya
National Institute of Information and Communications Technology (NICT), Koganei, Tokyo 184-8795, Japan
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Simoyama Takasi
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan
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Nagase Masanori
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan
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Abedin Kazi
National Institute of Information and Communications Technology (NICT), Koganei, Tokyo 184-8795, Japan
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Akimoto Ryoichi
National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Xue Yinghong
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan
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Mozume Teruo
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan
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Hasama Toshifumi
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan
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Tsuchida Hidemi
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Tsuchida Hidemi
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba 305-8568, Japan
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Tsuchida Hidemi
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan
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Tsuchida Hidemi
National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Kaji Ryosaku
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba 305-8568, Japan
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Ishikawa Hiroshi
National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Ishikawa Hiroshi
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan
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Akimoto Ryoichi
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan
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Tsuchida Hidemi
National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan
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Odate Satoru
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
著作論文
- Accidental Coincidence Counts Observed in Mandel Dip Measurement Using Independently Produced Photon Pairs at 1550 nm
- 10.5 km Fiber-Optic Quantum Key Distribution at 1550 nm with a Key Rate of 45 kHz
- Two-Coherent-State Quantum Key Distribution Using a Large Reference Pulse for Security Enhancement
- 1550 nm Single-Photon Detection for the Demonstration of Unconditionally Secure Fiber-Optic Quantum Key Distribution over 50 km(Recent Progress in Photon Detection Technology)
- A Method of Discarding After-Pulses in Single-Photon Detection for Quantum Key Distribution
- Violation of Bell’s Inequality in 1550 nm Band without Subtraction of Accidental Coincidences
- Timing Noise Measurement of 160-GHz Optical Pulses by Optoelectronic Harmonic Mixing(Ultrafast Photonics)
- Ultrafast All-Optical Refractive Index Modulation in Intersubband Transition Switch Using InGaAs/AlAs/AlAsSb Quantum Well
- Two-photon Interference at 1550 nm Using Two Periodically Poled Lithium Niobate Waveguides
- Direct Observation of Cross-Phase-Modulation-Induced Nonlinear Phase Noise
- Simulation of Cross Phase Modulation in Intersubband Transition of InGaAs/AlAs/AlAsSb Coupled Quantum Wells Based on Vector Signal Analysis of Electrical Signals
- Discharge Pulse Counting for Low-Noise Single-Photon Detection at 1550 nm Using InGaAs Avalanche Photodiode Cooled to 130 K
- Reconstruction of Photon Number Distribution without Relying on Photon Number-Resolving Detector
- Timing Adjustment of Incoming Photons in Gated-Mode Single-Photon Detection at 1550 nm