Ma T‐p | Center For Microelectronic Materials & Structures And Department Of Electrical Engineering Yale

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Center For Microelectronic Materials & Structures And Department Of Electrical Engineering Yale | 論文

• Front-and Back-Interface Trap Densities and Subthreshold Swings of Fully Depleted Mode Metal-Oxide-Semiconductor Transistors Fabricated on Separation-by-Implanted-Oxygen Substrates

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