OIKAWA T. | JEOL Ltd.
スポンサーリンク
概要
関連著者
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SHINDO D.
Institute for Advanced Materials Processing, Tohoku University
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OIKAWA T.
JEOL Ltd.
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Xia W.
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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KIM J.
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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TOMITA T.
JEOL Ltd.
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Kim J.
Institute Of Functional Genomics School Of Medicine Konkuk University
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Kim J.
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Murakami Y.
Institute for Materials Research, Tohoku University
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Lee Y.-s.
Institute For Advanced Materials Processing Tohoku University
著作論文
- Quantitative Electron Holographic Analysis of Electric Potential Distribution around FEG-Emitters
- Angular Dependence of B-K Edges in EELS