Morita Y | Joint Research Center For Atom Technology (jrcat):national Institute Of Advanced Industrial Science
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概要
- MORITA Yukinoriの詳細を見る
- 同名の論文著者
- Joint Research Center For Atom Technology (jrcat):national Institute Of Advanced Industrial Science の論文著者
Joint Research Center For Atom Technology (jrcat):national Institute Of Advanced Industrial Science | 論文
- Gate Length Dependence of Hot Carrier Reliability in Low-Temperature Polycrystatline-Silicon P-Channel Thin Film Transistors
- Suppression of Self-Heating in Low-Temperature Polycrystalline Silicon Thin-Film Transitors
- Monolayer Nitridation of Si(001) Surfaces
- Monolayer Nitridation of Si(001) Surfaces
- Tip-Induced Surface Disorder on Hydrogen-Terminated Silicon(111) Surface Observed by Ultrahigh-Vacuum Atomic Force Microscopy