Ohno Akira | Imaging Sci. And Engineering Lab Tokyo Inst. Of Technol.
スポンサーリンク
概要
関連著者
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Hanna Jun-ichi
Imaging Science & Engineering Laboratory Tokyo Institute Of Technology
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Ohno Akira
Imaging Sci. And Engineering Lab Tokyo Inst. Of Technol.
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Hanna Jun-ichi
Imaging Science And Engineering Lab Tokyo Institute Of Technology
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OHNO Akira
Imagining Science and Engineering Laboratory, Tokyo Institute of Technology
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DUNLAP David
Department of Physics and Astronomy, University of New Mexico
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Wu Jiang
Imaging Science And Engineering Lab Tokyo Institute Of Technology
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Hanna Jun-ichi
Imagining Science And Engineering Laboratory Tokyo Institute Of Technology
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Usui Takayuki
Imaging Science And Engineering Lab Tokyo Institute Of Technology
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Ahn Hyonsoo
Imagining Science and Engineering Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-
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Ohno Akira
Imaging Science And Engineering Lab Tokyo Institute Of Technology
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Ahn Hyonsoo
Imagining Science And Engineering Laboratory Tokyo Institute Of Technology
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Hanna Jun-ichi
Imagining Science and Engineering Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8503, Japan
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Cabral Aaron
Department of Physics and Astronomy, University of New Mexico, Albuquerque, New Mexico 87131, U.S.A.
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Ohno Akira
Imagining Science and Engineering Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8503, Japan
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Dunlap David
Department of Physics and Astronomy, University of New Mexico, 800 Yale Blvd NE, ABQ, NM 87131-0001, U.S.A.
著作論文
- Detection of Trace Amount of Impurity in Smectic Liquid Crystals
- Charge Carrier Transport Properties of Biphenyl Liquid Crystals with a Dimer Structure
- Analysis of Trap Distribution Using Time-of-Flight Spectroscopy
- Extraction of Trap Distribution in Organic Semiconductors by Transient Photocurrent