Verlinden B. | Department Mtm Katholieke Universiteit Leuven
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概要
関連著者
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Verlinden B.
Department Mtm Katholieke Universiteit Leuven
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Samajdar I.
Department Mtm Katholieke Universiteit Leuven
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VERLINDEN B.
Department MTM, Katholieke Universiteit Leuven
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Verlinden B
Katolieke Univ. Leuven Leuven Bel
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SAMAJDAR I.
Department of Metallurgical Engineering and Materials Science
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Samajdar I
Indian Inst. Technol. Mumbay Ind
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Samajdar I.
Centro Sviluppo Materiali
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Aernoudt E
Catholic Univ. Leuven Leuven Bel
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Aernoudt E.
Department Of Metallurgy And Materials Engineering Catholic University Of Leuven
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Girault E.
K. U. Leuven Department Of Metallurgy And Materials Engineering
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VANHOUTTE P.
Department MTM, Katholieke Universiteit Leuven
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CICALE S.
Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology
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ABBRUZZESE G.
Centro Sviluppo Materiali
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VAN HOUTTE
Department MTM, Katolieke Universiteit Leuven
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Van Houtte
Department Mtm Katholieke Universiteit Leuven
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Van Houtte
Department Mtm Katolieke Universiteit Leuven
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Verlinden B.
Department Mtm Katolieke Universiteit Leuven
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Cicale S.
Department Of Metallurgical Engineering And Materials Science Indian Institute Of Technology
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Vanhoutte P.
Department Mtm Katholieke Universiteit Leuven
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VAN HUMBEECK
K. U. Leuven, Department of Metallurgy and Materials Engineering
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GIRAULT E.
Department MTM, Katholieke Universiteit Leuven
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VAN HUMBEECK
Department MTM, Katholieke Universiteit Leuven
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BAN HOUTTE
Department MTM, Katholieku Universiteit Leuven
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Ban Houtte
Department Mtm Katholieku Universiteit Leuven
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Van Humbeeck
K. U. Leuven Department Of Metallurgy And Materials Engineering
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AERNOUDT E.
Department MTM, Katholieke Universiteit Leuven
著作論文
- Developments in Macro and Micro Texture during Plane Strain Channel Die Compression of IF Steel
- Development of Cold Rolled Texture and Microstructure in a Hot Band Fe-3%Si Steel
- Transformations during Intercritical Annealing of a TRIP-assisted Steel
- Textural Changes through Grain Growth in Ti-bearing IF-steel Investigated by Orientation Imaging Microscopy and X-ray Diffraction