Park J‐s | Hynix Semiconductor Inc. Chungbuk Kor
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概要
Hynix Semiconductor Inc. Chungbuk Kor | 論文
- Effect of Poly Metal Gate Etch Post-Cleaning on the Tail Distribution of DRAM Data Retention Time
- Impact of Gate Etch Damage and Profile in High Density DRAM Cell
- Impact of Polymetal Gate Etch Post-Cleaning on Data Retention Time in Sub-micron DRAM Cells
- High Pressure Synthesis of a New Perovskite, (SrLa)(MgMn)O_
- X-Ray Absorption Spectroscopic Studies on Layered FeWO_4Cl and Its Lithium Intercalate