DAIMON Hiroshi | Materials Science, Nara Institute of Science and Technology (NAIST)
スポンサーリンク
概要
関連著者
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MATSUSHITA Tomohiro
Japan Synchrotron Radiation Research Institute
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MATSUI Fumihiko
Materials Science, Nara Institute of Science and Technology (NAIST)
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DAIMON Hiroshi
Materials Science, Nara Institute of Science and Technology (NAIST)
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DAIMON Hiroshi
Nara Institute of Science and Technology (NAIST)
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Matsushita Tomohiro
Jasri Spring-8
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Guo Fang
Japan Synchrotron Radiation Research Institute
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Guo Fang
Japan Synchrotron Radiation Research Institute (jasri)
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Daimon Hiroshi
Graduate School Of Materials Science Nara Institute Of Science And Technology(naist)
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KATO Yukako
CREST-JST
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Kato Yukako
Nara Institute Of Science And Technology (naist):jasri Spring-8
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Tanaka Satoru
Department Of Anesthesiology Sapporo Medical University School Of Medicine
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Daimon Hiroshi
Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192, Japan
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Matsui Hirosuke
Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192, Japan
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Matsui Fumihiko
Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192, Japan
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Goto Kentaro
Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192, Japan
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Nishikayama Noriyuki
Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192, Japan
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Maejima Naoyuki
Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192, Japan
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Hashimoto Mie
Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192, Japan
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Hatayama Tomoaki
Materials Science, Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192, Japan
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Kato Yukako
Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, Sayo, Hyogo 679-5198, Japan
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Matsushita Tomohiro
Japan Synchrotron Radiation Research Institute (JASRI), SPring-8, Sayo, Hyogo 679-5198, Japan
著作論文
- Site-Specific Orbital Angular Momentum Analysis of Graphite Valence Electron Using Photoelectron Forward Focusing Peaks(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
- Site-Specific Stereograph of SiC(0001) Surface by Inverse Matrix Method