Nagashima Y | Tandem Accelerator Center University Of Tsukuba
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概要
Tandem Accelerator Center University Of Tsukuba | 論文
- Shadowing Pattern Imaging with High-Energy Secondary Electrons Induced by Fast Ions
- Impact Parameter Dependent Probability of Au L_3-Shell Ionization by 40.7 MeV Ar Ions
- Formation of Individual Holes in Amorphous SiO_2 by Swift Heavy-Ion Bombardment Followed by Wet and Dry Etching
- Structure of Latent Tracks Created by Swift Heavy Ions in Amorphous SiO2 and Zinc Phosphate Glass
- A Modified Method of Etching Semiconductors and Manufacturing Thin Silicon Solid-State Detectors