Hara M | Tokyo Inst. Technol. Kanagawa Jpn
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概要
Tokyo Inst. Technol. Kanagawa Jpn | 論文
- In situ Visualization of Degradation of Silicon Field Emitter Tips
- Electrical Conductivity of Lambda DNA-Pd Wire
- Atomic Force Microscope Cantilever Array for Parallel Lithography of Quantum Devices
- Effect of High Frequency Noise Current Sources on Noise Figure for Sub-50nm Node MOSFETs
- Equivalent Noise Temperature Representation for Scaled MOSFETs