Harada N | Kanagawa Industrial Technol. Res. Inst. Ebina‐shi Jpn
スポンサーリンク
概要
Kanagawa Industrial Technol. Res. Inst. Ebina‐shi Jpn | 論文
- 60-GHz HEMT-Based MMIC One-Chip Receiver
- Reliability Evaluation of Thin Gate Oxide Using a Flat Capacitor Test Structure (Special Issue on Microelectronic Test Structure)