IWANAGA Toshiaki | Media and Information Research Laboratories, NEC Corporation
スポンサーリンク
概要
関連著者
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Honma Hiromi
Media And Information Research Laboratories Nec Corporation
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NAKANO Masaki
Media and Information Research Laboratories, NEC Corporation
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IWANAGA Toshiaki
Media and Information Research Laboratories, NEC Corporation
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Nakano Miki
Nanotechnology Research Institute (nri) National Institute Of Advanced Industrial Science And Techno
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Ohkubo Shuichi
Media And Information Research Laboratories Nec Corporation
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OGAWA Masatsugu
Media and Information Research Laboratories, NEC Corporation
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OHKUBO Syuichi
Media and Information Research Laboratories, NEC Corporation
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ICHIMURA Tsutomu
Media and Information Research Laboratories, NEC Corporation
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Ogawa Masatsugu
Media And Information Research Laboratories Nec Corporation
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Iwanaga Toshiaki
Media and Information Research Laboratories, NEC Corporation, 1753 Shimonumabe, Nakahara-ku, Kawasaki, Kanagawa 211-8666, Japan
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Iwanaga Toshiaki
Media and Information Research Laboratories, NEC Corporation, 1753 Shimo-numabe, Nakahara-ku, Kawasaki, Kanagawa 211-8666, Japan
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Ichimura Tsutomu
Media and Information Research Laboratories, NEC Corporation, 1753 Shimonumabe, Nakahara-ku, Kawasaki, Kanagawa 211-8666, Japan
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Ohkubo Syuichi
Media and Information Research Laboratories, NEC Corporation, 1753 Shimonumabe, Nakahara-ku, Kawasaki, Kanagawa 211-8666, Japan
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Ogawa Masatsugu
Media and Information Research Laboratories, NEC Corporation, 1753 Shimonumabe, Nakahara-ku, Kawasaki, Kanagawa 211-8666, Japan
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Honma Hiromi
Media and Information Research Laboratories, NEC Corporation, 1753 Shimonumabe, Nakahara-ku, Kawasaki, Kanagawa 211-8666, Japan
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Honma Hiromi
Media and Information Research Laboratories, NEC Corporation, 1753 Shimo-numabe, Nakahara-ku, Kawasaki, Kanagawa 211-8666, Japan
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Nakano Masaki
Media and Information Research Laboratories, NEC Corporation, 1753 Shimonumabe, Nakahara-ku, Kawasaki, Kanagawa 211-8666, Japan
著作論文
- Optimization of Write Conditions with a New Measure in High-Density Optical Recording
- Signal-to-Noise Ratio in a Partial-Response Maximum-Likelihood Detection
- Optimization of Write Conditions with a New Measure in High-Density Optical Recording
- Signal-to-Noise Ratio in a Partial-Response Maximum-Likelihood Detection