Hishikawa Y | Japan Quality Assurance Organization Shizuoka Jpn
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概要
Japan Quality Assurance Organization Shizuoka Jpn | 論文
- Characterization of GaAs and AlGaAs layers grown by laser atomic layer epitaxy
- New Fabrication Technique of Quantum Wire Structures with Dimensions Precisely Controlled by the CBE Method
- Hysteresis-Free Amorphous Chiral Nematic Reflective Guest-Host Liquid Crystal Displays
- Pretilt Angles of Liquid Crystal on Organic-Solvent-Soluble Polyimide Alignment Films
- Synthesis of a Novel Organic-Solvent-Soluble Polyimide and Its Application to Alignment Film for Liquid Crystal Displays