Kikuta S | Environment & Analysis Technology Department Technical Support Center Sony Corporation
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概要
Environment & Analysis Technology Department Technical Support Center Sony Corporation | 論文
- Determination of the Density and the Thickness of SiO_2 Films Using Extremely Asymmetric X-Ray Diffraction
- Measurement of Local Lattice Distortion in Silicon by Imaging-Plate Plane-Wave X-Ray Topography with Image Magnification
- Time-Resolved X-Ray Diffraction Measurement of Silicon Surface during Laser Irradiation under Grazing-Incidence Conditions
- Novel Analysis System of Imaging-Plate Plane-Wave X-Ray Topography for Characterizing Lattice Distortion in Silicon
- Mossbauer Spectroscopy of La_Ca_FePO and LaFeAsO_F_ under External Magnetic Field and Nuclear Resonant Inelastic Scattering of La_Ca_FePO(Condensed matter: electronic structure and electrical, magnetic, and optical prop