Miake Takeshi | Sony Semiconductor Kyushu Co.
スポンサーリンク
概要
関連著者
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肥後 盛秀
国立大学法人 鹿児島大学大学院 理工学研究科 化学生命・化学工学専攻
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肥後 盛秀
鹿児島大学工学部応用化学工学科
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YOSHIDOME Toshifumi
Department of Applied Chemistry and Chemical Engineering, Faculty of Engineering, Kagoshima Universi
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MITSUSHIO Masaru
Department of Applied Chemistry and Chemical Engineering, Faculty of Engineering, Kagoshima Universi
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HIGO Morihide
Department of Applied Chemistry and Chemical Engineering, Faculty of Engineering, Kagoshima Universi
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Higo Morihide
Department Of Applied Chemistry And Chemical Engineering Faculty Of Engineering Kagoshima University
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Miake Takeshi
Sony Semiconductor Kyushu Co.
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OZONO Yoshihisa
Center for Instrumental Analysis, Kagoshima University
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Ozono Yoshihisa
Center For Instrumental Analysis Kagoshima University
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Mitsushio Masaru
Department Of Applied Chemistry And Chemical Engineering Faculty Of Engineering Kagoshima University
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Yoshidome T
Department Of Applied Chemistry And Chemical Engineering Faculty Of Engineering Kagoshima University
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Yoshidome Toshifumi
Department Of Applied Chemistry And Chemical Engineering Faculty Of Engineering Kagoshima University
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MITSUSHIO Masaru
Graduate School of Science and Engineering, Kagoshima University
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Mitsushio Masaru
Graduate School Of Science And Engineering Kagoshima University
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肥後 盛秀
Dep. Of Chemistry Biotechnology And Chemical Engineering Graduate School Of Sci. And Engineering Kag
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Yamagata Toshiyuki
Graduate School Of Sci. And Engineering Kagoshima Univ.
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MIAKE Takeshi
Department of Applied Chemistry and Chemical Engineering, Faculty of Engineering, Kagoshima Universi
著作論文
- Adsorption State and Morphology of Anthraquinone-2-carboxylic Acid Deposited from Solution onto the Atomically-Smooth Native Oxide Surface of Al(111) Films Studied by Infrared Reflection Absorption Spectroscopy, X-ray Photoelectron Spectroscopy, and Atomi
- Anthraquinone-2-carboxylic Acid Deposited from Solution onto Native Oxide Surfaces of Al Films Characterized by Inelastic Electron Tunneling Spectroscopy, X-ray Photoelectron Spectroscopy, and Atomic Force Microscopy