Kubota K | Semiconductor And Integrated Circuits Division Hitachi Ltd.
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概要
Semiconductor And Integrated Circuits Division Hitachi Ltd. | 論文
- Dielectric Degradation Mechanism of SiO_2 Examined by First-Principles Calculations : Electronic Conduction Associated with Electron Trap Levels in SiO_2 and Stability of Oxygen Vacancies Under an Electric Field
- Dielectric Degradation Mechanism of SiO_2 Examined through First-Principles Calculations : Electric Conduction Associated with Electron Traps and Its Stability under an Electric Field
- Excellence of Gate Oxide Integrity in Metal-Oxide-Semiconductor Large-Scale-Integrated Circuits Based on P^-/P^- Thin-Film Epitaxial Silicon Wafers
- Gamma-Ray-Induced Absorption Bands in Pure-Silica-Core Fibers
- Gamma-Ray Induced Absorption Band at 770 nm in Pure Silica Core Optical Fibers